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Atomic Resolution Grain Boundary Analysis Using Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1524-1525
- Print publication:
- July 2010
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Recent Advances in FIB-based Site-specific Atom Probe Specimen Preparation Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1634-1635
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- August 2007
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Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1296-1297
- Print publication:
- August 2006
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